JPH0520150B2 - - Google Patents

Info

Publication number
JPH0520150B2
JPH0520150B2 JP60083249A JP8324985A JPH0520150B2 JP H0520150 B2 JPH0520150 B2 JP H0520150B2 JP 60083249 A JP60083249 A JP 60083249A JP 8324985 A JP8324985 A JP 8324985A JP H0520150 B2 JPH0520150 B2 JP H0520150B2
Authority
JP
Japan
Prior art keywords
light
coating
control signal
primer
transparent panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60083249A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61242666A (ja
Inventor
Takeshi Nagata
Katsuto Fujita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sunstar Engineering Inc
Original Assignee
Sunstar Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sunstar Engineering Inc filed Critical Sunstar Engineering Inc
Priority to JP60083249A priority Critical patent/JPS61242666A/ja
Priority to US06/849,420 priority patent/US4707613A/en
Priority to KR1019860002932A priority patent/KR940002502B1/ko
Priority to EP86105320A priority patent/EP0198497B1/en
Priority to DE8686105320T priority patent/DE3688096T2/de
Publication of JPS61242666A publication Critical patent/JPS61242666A/ja
Publication of JPH0520150B2 publication Critical patent/JPH0520150B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Coating Apparatus (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP60083249A 1985-04-18 1985-04-18 薄膜状塗布剤検査装置 Granted JPS61242666A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP60083249A JPS61242666A (ja) 1985-04-18 1985-04-18 薄膜状塗布剤検査装置
US06/849,420 US4707613A (en) 1985-04-18 1986-04-08 Inspecting device for a thin film coating material with applicator-following detector
KR1019860002932A KR940002502B1 (ko) 1985-04-18 1986-04-16 박막상 도포제 검사장치
EP86105320A EP0198497B1 (en) 1985-04-18 1986-04-17 Device for inspecting a thin film coating material
DE8686105320T DE3688096T2 (de) 1985-04-18 1986-04-17 Vorrichtung zur pruefung einer duennen schicht von ueberzugsmaterial.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60083249A JPS61242666A (ja) 1985-04-18 1985-04-18 薄膜状塗布剤検査装置

Publications (2)

Publication Number Publication Date
JPS61242666A JPS61242666A (ja) 1986-10-28
JPH0520150B2 true JPH0520150B2 (en]) 1993-03-18

Family

ID=13797056

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60083249A Granted JPS61242666A (ja) 1985-04-18 1985-04-18 薄膜状塗布剤検査装置

Country Status (5)

Country Link
US (1) US4707613A (en])
EP (1) EP0198497B1 (en])
JP (1) JPS61242666A (en])
KR (1) KR940002502B1 (en])
DE (1) DE3688096T2 (en])

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01310485A (ja) * 1988-06-08 1989-12-14 Dainippon Printing Co Ltd 欠陥情報検出装置
JPH0333356U (en]) * 1989-08-09 1991-04-02
US5066132A (en) * 1989-08-09 1991-11-19 Sunstar Engineering, Inc. Method of and apparatus for inspecting paint coating
JPH0726692Y2 (ja) * 1989-08-09 1995-06-14 サンスター技研株式会社 薄膜状塗布剤の検査装置
JPH0371006A (ja) * 1989-08-09 1991-03-26 Sunstar Eng Inc 薄膜状塗布剤の検査装置
JPH07119590B2 (ja) * 1989-08-09 1995-12-20 サンスター技研株式会社 薄膜状塗布剤の検査装置
JPH047031A (ja) * 1990-04-24 1992-01-10 Pioneer Electron Corp Ｌｂ膜作成装置
DE4419346A1 (de) * 1994-06-03 1995-12-07 Bernd Dr Ing Platz Anordnung zur Überwachung der Beschichtung von Werkstoff(stück)oberflächen
KR100452433B1 (ko) * 2001-09-04 2004-10-12 현대자동차주식회사 글래스 마운팅을 위한 프라이머 도포용 기구
JP2006192392A (ja) * 2005-01-14 2006-07-27 Honda Motor Co Ltd ウインドガラス接着剤塗布の前処理装置及びその方法
JP2007263599A (ja) * 2006-03-27 2007-10-11 Mazda Motor Corp 塗布状態評価方法及び塗布状態評価装置
JP5248122B2 (ja) * 2008-01-21 2013-07-31 日邦興産株式会社 自動塗布システム、および自動塗布システムの制御方法
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业（深圳）有限公司 检测装置
US20220107631A1 (en) * 2019-02-04 2022-04-07 Abb Schweiz Ag Coating Process and Quality Control of Coated Objects
CN110118529B (zh) * 2019-05-16 2020-11-24 中国工程物理研究院电子工程研究所 一种圆片尺寸的测量方法
FR3101947B1 (fr) * 2019-10-15 2023-11-24 Cie Plastic Omnium Se Dispositif et procédé pour l’évaluation de la qualité d’un revêtement
US11933733B2 (en) * 2021-06-30 2024-03-19 Fca Us Llc Non-destructive glass priming verification method for installed glass

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2641158A (en) * 1948-12-29 1953-06-09 Gen Aniline & Film Corp Graininess meter
US3518013A (en) * 1966-09-26 1970-06-30 Itek Corp Densitometer
NL7105871A (en]) * 1971-04-29 1972-10-31
US3840302A (en) * 1971-06-01 1974-10-08 D Brunton Oscilloscope presentation of sheet profile from a scanning gage
US3754146A (en) * 1972-03-27 1973-08-21 Du Pont Apparatus and method for detecting streaks in coated layers on a web
GB2025037A (en) * 1978-06-26 1980-01-16 Agfa Gevaert Nv Photoelectric detection of flaws in sheets
US4367244A (en) * 1980-10-27 1983-01-04 Oregon Graduate Center For Study And Research Method for monitoring and controlling the distribution of droplets on a surface
US4468695A (en) * 1980-11-20 1984-08-28 Tokico Ltd. Robot
JPS58143864A (ja) * 1982-02-22 1983-08-26 Nissan Motor Co Ltd 粘性流体塗布装置の塗布経路監視装置

Also Published As

Publication number Publication date
DE3688096T2 (de) 1993-09-09
KR860008452A (ko) 1986-11-15
EP0198497A3 (en) 1989-08-30
JPS61242666A (ja) 1986-10-28
US4707613A (en) 1987-11-17
KR940002502B1 (ko) 1994-03-25
DE3688096D1 (de) 1993-04-29
EP0198497B1 (en) 1993-03-24
EP0198497A2 (en) 1986-10-22

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